Physics-Informed Artificial Neural Network-Based Estimation of Dielectric Properties for Resonant Method

Authors

  • Nur Sofia Idayu Didik Aprianto Faculty of Electrical and Electronics Engineering Technology, Universiti Malaysia Pahang Al-Sultan Abdullah, 26600 Pekan, Pahang, Malaysia
  • Syamimi Mardiah Shaharum Faculty of Electrical and Electronics Engineering Technology, Universiti Malaysia Pahang Al-Sultan Abdullah, 26600 Pekan, Pahang, Malaysia
  • Nurfarhana Mustafa Faculty of Electrical and Electronics Engineering Technology, Universiti Malaysia Pahang Al-Sultan Abdullah, 26600 Pekan, Pahang, Malaysia
  • Ahmad Afif Mohd Faudzi Faculty of Electrical and Electronics Engineering Technology, Universiti Malaysia Pahang Al-Sultan Abdullah, 26600 Pekan, Pahang, Malaysia
  • Ahmad Syahiman Mohd Shah Faculty of Electrical and Electronics Engineering Technology, Universiti Malaysia Pahang Al-Sultan Abdullah, 26600 Pekan, Pahang, Malaysia
  • Toshihide Kitazawa Ritsumeikan University, 525-8577 Shiga, Japan
  • Mohamad Shaiful Abdul Karim Faculty of Electrical and Electronics Engineering Technology, Universiti Malaysia Pahang Al-Sultan Abdullah, 26600 Pekan, Pahang, Malaysia

Keywords:

Artificial Neural Network, Microwave resonator, Dielectric characterization, Quality factor, Permittivity

Abstract

Accurate determination of dielectric properties, particularly relative permittivity (εr) and loss tangent (tan δ), is essential in microwave material characterization. This paper proposes an artificial neural network (ANN)-based approach that leverages resonant features of a rectangular cavity resonator to estimate dielectric properties. Full-wave electromagnetic simulations in Computer Simulation Technology Studio Suite were performed over the X-band frequency range (8–12 GHz), covering a wide set of low-loss dielectric samples with permittivity between 1 and 10 and loss tangent values from 0.001 to 0.2. Transmission responses were generated, from which resonant frequency and quality factor (Q) were extracted as input features for a two-layer ANN implemented in MATLAB. The model achieved excellent predictive accuracy, with coefficient of determination values exceeding 0.999 and mean percentage errors below 0.2% for both εr and tan δ. Results demonstrate that resonant frequency is highly sensitive to permittivity variations, while Q-factor effectively captures dielectric losses. The proposed framework was further validated using a Teflon sample in the X-band, where the ANN predicted a relative permittivity of 2.01 and a loss tangent of 0.0014, in close agreement with literature values. These results highlight the potential of the proposed ANN framework for efficient and non-destructive dielectric property estimation.

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Published

14-05-2026

How to Cite

Didik Aprianto, N. S. I., Shaharum, S. M., Mustafa, N., Mohd Faudzi, A. A., Mohd Shah, A. S., Kitazawa, T., & Abdul Karim, M. S. (2026). Physics-Informed Artificial Neural Network-Based Estimation of Dielectric Properties for Resonant Method. Applications of Modelling and Simulation, 10, 120–129. Retrieved from https://www.ojs.arqiipubl.com/index.php/AMS_Journal/article/view/1098

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