Loh, S. H., Teh, P. C., Sim, J. J., Tai, C. K., Yeap, K. H., Lee, Y. J., & Mazlan, A. U. (2023). Decoding Dot Peen Data Matrix Code with Deep Learning Capability for Product Traceability. Applications of Modelling and Simulation, 7, 38–48. Retrieved from https://www.ojs.arqiipubl.com/index.php/AMS_Journal/article/view/385